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1

[IEEE 2009 22nd International Conference on VLSI Design: concurrently with the 8th International Conference on Embedded Systems - New Delhi, India (2009.01.5-2009.01.9)] 2009 22nd International Conference on VLSI Design - Defect Aware to Power Conscious Tests - The New DFT Landscape

Mukherjee, Nilanjan, Rajski, Janusz, Tyszer, Jerzy

Year:

2009

Language:

english

File:

PDF, 233 KB

english, 2009

2

Economic Integration of Socialist Countries and International Unification of Their Laws

Journal:

Review of Socialist Law

Year:

1982

Language:

english

File:

PDF, 797 KB

english, 1982

3

Logic BIST with Capture-per-Clock Hybrid Test Points

Moghaddam, Elham, Mukherjee, Nilanjan, Rajski, Janusz, Solecki, Jedrzej, Tyszer, Jerzy, Zawada, Justyna

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2018

Language:

english

File:

PDF, 2.50 MB

english, 2018

4

Scan Integrity Tests for EDT Compression

Cheng, Wu-Tung, Rajski, Grzegorz Mrugalski Janusz, Trawka, Maciej, Tyszer, Jerzy

Journal:

IEEE Design and Test

Year:

2020

Language:

english

File:

PDF, 4.41 MB

english, 2020

5

Isolation of Failing Scan Cells through Convolutional Test Response Compaction

Grzegorz Mrugalski, Janusz Rajski, Chen Wang, Artur Pogiel, Jerzy Tyszer

Journal:

Journal of Electronic Testing

Year:

2007

Language:

english

File:

PDF, 315 KB

english, 2007

6

Fault Diagnosis with Orthogonal Compactors in Scan-Based Designs

Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jędrzej Solecki, Jerzy Tyszer

Journal:

Journal of Electronic Testing

Year:

2011

Language:

english

File:

PDF, 299 KB

english, 2011

7

Combinatorial Approach to Multiple Contact Faults Coverage in Programmable Logic Arrays

Rajski, Janusz, Tyszer, Jerzy

Journal:

IEEE Transactions on Computers

Year:

1985

Language:

english

File:

PDF, 925 KB

english, 1985

8

[IEEE 2012 17th IEEE European Test Symposium (ETS) - Annecy, France (2012.05.28-2012.05.31)] 2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) - Bandwidth-aware test compression logic for SoC designs

Janicki, Jakub, Tyszer, Jerzy, Mrugalski, Grzegorz, Rajski, Janusz

Year:

2012

Language:

english

File:

PDF, 874 KB

english, 2012

9

[IEEE 2011 16th IEEE European Test Symposium (ETS) - Trondheim, Norway (2011.05.23-2011.05.27)] 2011 Sixteenth IEEE European Test Symposium - Reduced ATE Interface for High Test Data Compression

Czysz, Dariusz, Mrugalski, Grzegorz, Mukherjee, Nilanjan, Rajski, Janusz, Tyszer, Jerzy

Year:

2011

Language:

english

File:

PDF, 564 KB

english, 2011

10

[IEEE 2011 IEEE 20th Asian Test Symposium (ATS) - New Delhi, India (2011.11.20-2011.11.23)] 2011 Asian Test Symposium - Power Aware Embedded Test

Lin, Xijiang, Moghaddam, Elham, Mukherjee, Nilanjan, Nadeau-Dostie, Benoit, Rajski, Janusz, Tyszer, Jerzy

Year:

2011

File:

PDF, 1.50 MB

2011

11

EDT Bandwidth Management in SoC Designs

Janicki, Jakub, Kassab, Mark, Mrugalski, Grzegorz, Mukherjee, Nilanjan, Rajski, Janusz, Tyszer, Jerzy

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2012

Language:

english

File:

PDF, 4.69 MB

english, 2012

12

Test Time Reduction in EDT Bandwidth Management for SoC Designs

Janicki, Jakub, Kassab, Mark, Mrugalski, Grzegorz, Mukherjee, Nilanjan, Rajski, Janusz, Tyszer, Jerzy

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2013

Language:

english

File:

PDF, 585 KB

english, 2013

13

Low-Power Programmable PRPG With Test Compression Capabilities

Filipek, Michal, Mrugalski, Grzegorz, Mukherjee, Nilanjan, Nadeau-Dostie, Benoit, Rajski, Janusz, Solecki, Jedrzej, Tyszer, Jerzy

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Year:

2015

Language:

english

File:

PDF, 4.42 MB

english, 2015

14

[IEEE 2011 IEEE 20th Asian Test Symposium (ATS) - New Delhi, India (2011.11.20-2011.11.23)] 2011 Asian Test Symposium - Low Power Decompressor and PRPG with Constant Value Broadcast

Filipek, Michal, Fukui, Yoshiaki, Iwata, Hiroyuki, Mrugalski, Grzegorz, Rajski, Janusz, Takakura, Masahiro, Tyszer, Jerzy

Year:

2011

File:

PDF, 795 KB

2011

15

[IEEE 2012 IEEE 30th VLSI Test Symposium (VTS) - Maui, HI, USA (2012.04.23-2012.04.25)] 2012 IEEE 30th VLSI Test Symposium (VTS) - Test generator with preselected toggling for low power built-in self-test

Rajski, Janusz, Tyszer, Jerzy, Mrugalski, Grzegorz, Nadeau-Dostie, Benoit

Year:

2012

Language:

english

File:

PDF, 720 KB

english, 2012

16

[IEEE 2014 IEEE 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Warsaw, Poland (2014.4.23-2014.4.25)] 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems - Quality assurance in memory built-in self-test tools

Au, Albert, Pogiel, Artur, Rajski, Janusz, Sydow, Piotr, Tyszer, Jerzy, Zawada, Justyna

Year:

2014

Language:

english

File:

PDF, 416 KB

english, 2014

17

Scan Test Bandwidth Management for Ultralarge-Scale System-on-Chip Architectures

Cheng, Wu-Tung, Dong, Yan, Gilles, Grady, Huang, Yu, Janicki, Jakub, Kassab, Mark, Mrugalski, Grzegorz, Mukherjee, Nilanjan, Rajski, Janusz, Tyszer, Jerzy

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Year:

2015

Language:

english

File:

PDF, 3.65 MB

english, 2015

18

[IEEE 2010 15th IEEE European Test Symposium (ETS) - Praha, Czech Republic (2010.05.24-2010.05.28)] 2010 15th IEEE European Test Symposium - Diagnosis of failing scan cells through orthogonal response compaction

Benware, Brady, Mrugalski, Grzegorz, Pogiel, Artur, Rajski, Janusz, Solecki, Jedrzej, Tyszer, Jerzy

Year:

2010

Language:

english

File:

PDF, 748 KB

english, 2010

19

[IEEE 2011 IEEE 20th Asian Test Symposium (ATS) - New Delhi, India (2011.11.20-2011.11.23)] 2011 Asian Test Symposium - Fault Diagnosis in Memory BIST Environment with Non-march Tests

Mrugalski, Grzegorz, Pogiel, Artur, Mukherjee, Nilanjan, Rajski, Janusz, Tyszer, Jerzy, Urbanek, Pawel

Year:

2011

File:

PDF, 1.07 MB

2011

20

Erratum to “Test Time Reduction in EDT Bandwidth Management for SoC Designs” [Nov 13 1776-1786]

Janicki, Jakub, Kassab, Mark, Mrugalski, Grzegorz, Mukherjee, Nilanjan, Rajski, Janusz, Tyszer, Jerzy

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2014

Language:

english

File:

PDF, 532 KB

english, 2014

21

[IEEE 2009 22nd International Conference on VLSI Design: concurrently with the 8th International Conference on Embedded Systems - New Delhi, India (2009.01.5-2009.01.9)] 2009 22nd International Conference on VLSI Design - High-Speed On-Chip Event Counters for Embedded Systems

Mukherjee, Nilanjan, Pogiel, Artur, Rajski, Janusz, Tyszer, Jerzy

Year:

2009

Language:

english

File:

PDF, 310 KB

english, 2009

22

[IEEE 2014 IEEE 23rd Asian Test Symposium (ATS) - Hangzhou, China (2014.11.16-2014.11.19)] 2014 IEEE 23rd Asian Test Symposium - High-Speed Serial Embedded Deterministic Test for System-on-Chip Designs

Trawka, Maciej, Mrugalski, Grzegorz, Mukherjee, Nilanjan, Pogiel, Artur, Rajski, Janusz, Janicki, Jakub, Tyszer, Jerzy

Year:

2014

Language:

english

File:

PDF, 1.19 MB

english, 2014

23

[IEEE 25th IEEE VLSI Test Symmposium - Berkeley, CA, USA (2007.05.6-2007.05.10)] 25th IEEE VLSI Test Symmposium (VTS'07) - Low Power Embedded Deterministic Test

Czysz, Dariusz, Mrugalski, Grzegorz, Rajski, Janusz, Tyszer, Jerzy

Year:

2007

Language:

english

File:

PDF, 269 KB

english, 2007

24

[IEEE 2009 27th IEEE VLSI Test Symposium (VTS) - Santa Cruz, CA, USA (2009.05.3-2009.05.7)] 2009 27th IEEE VLSI Test Symposium - Highly X-Tolerant Selective Compaction of Test Responses

Mrugalski, Grzegorz, Mukherjee, Nilanjan, Rajski, Janusz, Czysz, Dariusz, Tyszer, Jerzy

Year:

2009

Language:

english

File:

PDF, 753 KB

english, 2009

25

[IEEE 2011 16th IEEE European Test Symposium (ETS) - Trondheim, Norway (2011.05.23-2011.05.27)] 2011 Sixteenth IEEE European Test Symposium - Diagnosis of Failing Scan Cells through Orthogonal Response Compaction

Benware, Brady, Mrugalski, Grzegorz, Pogiel, Artur, Rajski, Janusz, Solecki, Jedrzej, Tyszer, Jerzy

Year:

2011

Language:

english

File:

PDF, 349 KB

english, 2011

26

[IEEE 2014 IEEE 23rd Asian Test Symposium (ATS) - Hangzhou, China (2014.11.16-2014.11.19)] 2014 IEEE 23rd Asian Test Symposium - Low Power Test Compression with Programmable Broadcast-Based Control

Milewski, Sylwester, Mrugalski, Grzegorz, Rajski, Janusz, Tyszer, Jerzy

Year:

2014

Language:

english

File:

PDF, 675 KB

english, 2014

27

Isometric Test Data Compression

Kumar, Amit, Kassab, Mark, Moghaddam, Elham, Mukherjee, Nilanjan, Rajski, Janusz, Reddy, Sudhakar, Tyszer, Jerzy, Wang, Chen

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2015

Language:

english

File:

PDF, 2.47 MB

english, 2015

28

[ACM Press the 43rd annual conference - San Francisco, CA, USA (2006.07.24-2006.07.28)] Proceedings of the 43rd annual conference on Design automation - DAC '06 - Test response compactor with programmable selector

Mrugalski, Grzegorz, Rajski, Janusz, Tyszer, Jerzy

Year:

2006

Language:

english

File:

PDF, 647 KB

english, 2006

29

[ACM Press the The 51st Annual Design Automation Conference - San Francisco, CA, USA (2014.06.01-2014.06.05)] Proceedings of the The 51st Annual Design Automation Conference on Design Automation Conference - DAC '14 - On Using Implied Values in EDT-based Test Compression

Gębala, Marcin, Mrugalski, Grzegorz, Mukherjee, Nilanjan, Rajski, Janusz, Tyszer, Jerzy

Year:

2014

Language:

english

File:

PDF, 610 KB

english, 2014

30

[ACM Press the 52nd Annual Design Automation Conference - San Francisco, California (2015.06.07-2015.06.11)] Proceedings of the 52nd Annual Design Automation Conference on - DAC '15 - Design for low test pattern counts

Konuk, Haluk, Moghaddam, Elham, Mukherjee, Nilanjan, Rajski, Janusz, Solanki, Deepak, Tyszer, Jerzy, Zawada, Justyna

Year:

2015

Language:

english

File:

PDF, 388 KB

english, 2015

31

[ACM Press the 44th annual conference - San Diego, California (2007.06.04-2007.06.08)] Proceedings of the 44th annual conference on Design automation - DAC '07 - New test data decompressor for low power applications

Mrugalski, Grzegorz, Rajski, Janusz, Czysz, Dariusz, Tyszer, Jerzy

Year:

2007

Language:

english

File:

PDF, 159 KB

english, 2007

32

[IEEE 2015 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2015.10.6-2015.10.8)] 2015 IEEE International Test Conference (ITC) - A deterministic BIST scheme based on EDT-compressed test patterns

Mrugalski, Grzegorz, Rajski, Janusz, Rybak, Lukasz, Solecki, Jedrzej, Tyszer, Jerzy

Year:

2015

Language:

english

File:

PDF, 1015 KB

english, 2015

33

Some Legal Aspects of East-West Trade in the Light of the Recent Changes of the Law of East European States

Journal:

Nordic Journal of International Law

Year:

1987

Language:

english

File:

PDF, 743 KB

english, 1987

34

[IEEE 2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC) - San Francisco, CA, USA (2014.6.1-2014.6.5)] 2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC) - On using implied values in EDT-based test compression

Gebala, Marcin, Mrugalski, Grzegorz, Mukherjee, Nilanjan, Rajski, Janusz, Tyszer, Jerzy

Year:

2014

File:

PDF, 621 KB

2014

35

[IEEE 2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC) - San Francisco, CA, USA (2014.6.1-2014.6.5)] 2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC) - On using implied values in EDT-based test compression

Gebala, Marcin, Mrugalski, Grzegorz, Mukherjee, Nilanjan, Rajski, Janusz, Tyszer, Jerzy

Year:

2014

Language:

english

File:

PDF, 621 KB

english, 2014

36

[IEEE 2015 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2015.10.6-2015.10.8)] 2015 IEEE International Test Conference (ITC) - Embedded deterministic test points for compact cell-aware tests

Acero, Cesar, Feltham, Derek, Hapke, Friedrich, Moghaddam, Elham, Mukherjee, Nilanjan, Neerkundar, Vidya, Patyra, Marek, Rajski, Janusz, Tyszer, Jerzy, Zawada, Justyna

Year:

2015

Language:

english

File:

PDF, 1.09 MB

english, 2015

37

[IEEE 2015 IEEE 24th Asian Test Symposium (ATS) - Mumbai, India (2015.11.22-2015.11.25)] 2015 IEEE 24th Asian Test Symposium (ATS) - TestExpress - New Time-Effective Scan-Based Deterministic Test Paradigm

Mrugalski, Grzegorz, Rajski, Janusz, Solecki, Jedrzej, Tyszer, Jerzy, Wang, Chen

Year:

2015

Language:

english

File:

PDF, 1.10 MB

english, 2015

38

Some Legal Aspects of International Compensation Trade

Journal:

International and Comparative Law Quarterly

Year:

1986

Language:

english

File:

PDF, 501 KB

english, 1986

39

The New Polish Private International Law, 1965

Journal:

International and Comparative Law Quarterly

Year:

1966

Language:

english

File:

PDF, 1.45 MB

english, 1966

40

Some Legal Aspects of International Compensation Trade

Journal:

International and Comparative Law Quarterly

Year:

1986

Language:

english

File:

PDF, 1.12 MB

english, 1986

41

Star-EDT: Deterministic On-Chip Scheme Using Compressed Test Patterns

Mrugalski, Grzegorz, Rajski, Janusz, Rybak, Lukasz, Solecki, Jedrzej, Tyszer, Jerzy

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2016

Language:

english

File:

PDF, 7.79 MB

english, 2016

42

Trimodal Scan-Based Test Paradigm

Mrugalski, Grzegorz, Rajski, Janusz, Solecki, Jedrzej, Tyszer, Jerzy, Wang, Chen

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Year:

2016

Language:

english

File:

PDF, 4.01 MB

english, 2016

43

[IEEE 2016 IEEE 25th Asian Test Symposium (ATS) - Hiroshima, Japan (2016.11.21-2016.11.24)] 2016 IEEE 25th Asian Test Symposium (ATS) - On Test Points Enhancing Hardware Security

Moghaddam, Elham, Mukherjee, Nilanjan, Rajski, Janusz, Tyszer, Jerzy, Zawada, Justyna

Year:

2016

Language:

english

File:

PDF, 302 KB

english, 2016

44

[IEEE 2016 IEEE International Test Conference (ITC) - Fort Worth, TX, USA (2016.11.15-2016.11.17)] 2016 IEEE International Test Conference (ITC) - Test point insertion in hybrid test compression/LBIST architectures

Moghaddam, Elham, Mukherjee, Nilanjan, Rajski, Janusz, Tyszer, Jerzy, Zawada, Justyna

Year:

2016

Language:

english

File:

PDF, 571 KB

english, 2016

45

[IEEE 2016 IEEE International Test Conference (ITC) - Fort Worth, TX, USA (2016.11.15-2016.11.17)] 2016 IEEE International Test Conference (ITC) - Minimal area test points for deterministic patterns

Liu, Yingdi, Moghaddam, Elham, Mukherjee, Nilanjan, Reddy, Sudhakar M., Rajski, Janusz, Tyszer, Jerzy

Year:

2016

Language:

english

File:

PDF, 502 KB

english, 2016

46

Embedded Deterministic Test Points

Acero, Cesar, Feltham, Derek, Liu, Yingdi, Moghaddam, Elham, Mukherjee, Nilanjan, Patyra, Marek, Rajski, Janusz, Reddy, Sudhakar M., Tyszer, Jerzy, Zawada, Justyna

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Year:

2017

Language:

english

File:

PDF, 2.97 MB

english, 2017

47

Hardware Protection via Logic Locking Test Points

Chen, Michael, Moghaddam, Elham, Mukherjee, Nilanjan, Rajski, Janusz, Tyszer, Jerzy, Zawada, Justyna

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2018

Language:

english

File:

PDF, 2.43 MB

english, 2018

48

[IEEE 2017 22nd IEEE European Test Symposium (ETS) - Limassol, Cyprus (2017.5.22-2017.5.26)] 2017 22nd IEEE European Test Symposium (ETS) - ROM fault diagnosis for O(n 2 ) test algorithms

Pogiel, Artur, Rajski, Janusz, Tyszer, Jerzy

Year:

2017

Language:

english

File:

PDF, 823 KB

english, 2017

49

[IEEE 2017 IEEE International Test Conference (ITC) - Fort Worth, TX (2017.10.31-2017.11.2)] 2017 IEEE International Test Conference (ITC) - Full-scan LBIST with capture-per-cycle hybrid test points

Milewski, Sylwester, Mukherjee, Nilanjan, Rajski, Janusz, Solecki, Jedrzej, Tyszer, Jerzy, Zawada, Justyna

Year:

2017

Language:

english

File:

PDF, 1.41 MB

english, 2017

50

[IEEE 2018 IEEE 36th VLSI Test Symposium (VTS) - San Francisco, CA, USA (2018.4.22-2018.4.25)] 2018 IEEE 36th VLSI Test Symposium (VTS) - Staggered ATPG with capture-per-cycle observation test points

Liu, Yingdi, Rajski, Janusz, Reddy, Sudhakar M., Solecki, Jedrzej, Tyszer, Jerzy

Year:

2018

Language:

english

File:

PDF, 659 KB

english, 2018